我想检测串行数据信号(din)的边缘。我已经在VHDL中编写了以下代码,该代码运行成功,但是在一个时钟周期延迟时检测到边沿,即在每个边沿处产生一个clk_50mhz周期延迟的变化输出。谁能帮助我毫不拖延地检测边缘。谢谢。
process (clk_50mhz)
begin
if clk_50mhz'event and clk_50mhz = '1' then
if (rst = '0') then
shift_reg <= (others => '0');
else
shift_reg(1) <= shift_reg(0);
shift_reg(0) <= din;
end if;
end if;
end process;
process (clk_50mhz)
begin
if clk_50mhz'event and clk_50mhz = '1' then
if rst = '0' then
change <= '0' ;
elsif(clk_enable_2mhz = '1') then
change <= shift_reg(0) xor shift_reg(1);
end if ;
end if ;
end process ;
当我将代码更改为以下时,我能够检测到边缘
process (clk_50mhz)
begin
if clk_50mhz'event and clk_50mhz = '1' then
if (RST = '0') then
shift_reg <= (others=>'0');
else
shift_reg(1) <= shift_reg(0);
shift_reg(0) <= din;
end if;
end if;
end process;
change <= shift_reg(1) xor din;
答案 0 :(得分:2)
你去吧
library ieee;
use ieee.std_logic_1164.all;
entity double_edge_detector is
port (
clk_50mhz : in std_logic;
rst : in std_logic;
din : in std_logic;
change : out std_logic
);
end double_edge_detector;
architecture bhv of double_edge_detector is
signal din_delayed1 :std_logic;
begin
process(clk_50mhz)
begin
if rising_edge(clk_50mhz) then
if rst = '1' then
din_delayed1 <= '0';
else
din_delayed1 <= din;
end if;
end if;
end process;
change <= (din_delayed1 xor din); --rising or falling edge (0 -> 1 xor 1 -> 0)
end bhv;
答案 1 :(得分:1)
您必须使用组合过程来检测差异,而不会产生额外的时钟周期延迟。 (您仍然需要一个寄存器来延迟输入。)
DELAY: process(clk_50mhz)
begin
if clk_50mhz'event and clk_50mhz = '1' then
din_reg <= din;
end if;
end process;
change <= din xor din_reg;